SII Semicondutor, a subsidiary of Seiko Instruments, together with the research team of Professor Shigetoshi Sugawa and Associate Professor Rihito Kuroda from Tohoku University, announces the development of mass production technology of a silicon-based ultraviolet (UV) sensor that detects from UV-A (315-400nm) to UV-B (280-315nm) ranges.
By taking the difference between the high sensitivity photodiode and the low sensitivity photodiode, it is possible to cut the visible light region without a filter so that decrease of transmittance is prevented.
Awareness of prevention of sunburn and spots are increasing in the field of healthcare. With the new technology, it is possible to measure from UV-A causing spots and wrinkles to UV-B causing sunburn with silicon semiconductor. By adopting a small transparent resin package, measurement with a smartphone or a wearable device becomes possible, so it is expected that anyone can check level of ultraviolet rays easily.
Traditional compound semiconductor sensors are manufactured using special compound wafers, but silicon semiconductors have high versatility. Silicon based sensors are excellent for future circuit integration and development of features.
The mass production technology will be used in own front-end fab of SII Semiconductor to produce the UV sensor. Shipment of mass production devices are expected in the spring of 2018.
Source: SII Semiconductor